Bulk analysis of particulate samples will be performed by XRF spectrometry on a Kevex 770/8000 system for the following elements; Mg, Al, Si. P, S, K, Ca, Ti, Ba, V, Cr, Mn, Fe, Cu, Zn, As, Sr, and Pb. Analysis will be performed using the thin film technique standardized by sediment, rock, and soil standards using direct and secondary excitation. Individual particle identification will be performed by an SEM equiped with an x-ray detector for chemical identification. Features analysis programs will be used to ascertain the average size and distribution of various particles in the bouyant plume samples at the various vents.
--GL
CTD Particulate samples | 95 |
CTD SEM Samples | 9 |
CTD Helium Samples | 108 |
CTD Nutrient Samples | 97 |
CTD Silica Samples | 88 |
CTD TDM Samples | 18 |
CTD DTM Samples | 64 |
CTD Oxidizaion Samples | 55 |
CTD Gas Samples | 108 |
CTD Bio Samples | 108 |
Alvin Particulate Samples | 17 |
Replicates | 17 |
Alvin SEM Samples | 21 |
Alvin Rare Earth Particulate | 14 |
Alvin DTM Samples | 17 |
Alvin Nutrient Samples | 17 |
Alvin Silica Samples | 17 |
Alvin Oxidizaion Samples | 14 |
Alvin Gas Samples | 14 |
Alvin Bio Samples | 2 |